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IAEA-TECDOC-1822
English IAEA-TECDOC-1822 | 978-92-0-106317-5
244 pages | 141 figures | € 18.00 | Date published: 2017Ion beam analysis techniques are non-destructive analytical techniques used to identify the composition and structure of surface layers of materials. The applications of these techniques span environmental control, cultural heritage and conservation, materials and fusion technologies. The particle-induced gamma-ray emission (PIGE) spectroscopy technique in particular, is a powerful tool for detecting light elements in certain depths of surface layers. This publication describes the coordinated effort to measure and compile cross section data relevant to PIGE analysis and make these data available to the community of practice through a comprehensive online database.
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