<dd id="rw0xn"></dd>
If you would like to learn more about the IAEA’s work, sign up for our weekly updates containing our most important news, multimedia and more.
IAEA-TECDOC-1780
English IAEA-TECDOC-1780 | 978-92-0-110515-8
224 pages | 168 figures | € 18.00 | Date published: 2015Ion beam analysis techniques are non-destructive analytical techniques used to identify the composition and provide elemental depth profiles in surface layers of materials. The applications of such techniques are diverse and include environmental control, cultural heritage and conservation and fusion technologies. Their reliability and accuracy depends strongly on our knowledge of the nuclear reaction cross sections, and this publication describes the coordinated effort to measure, compile and evaluate cross section data relevant to these techniques and make these data available to the user community through a comprehensive online database. It includes detailed assessments of experimental cross sections as well as attempts to benchmark these data against appropriate integral measurements.
More Information on reusing IAEA copyright material.
Orders and requests for information may also be addressed to:
Publishing Section
International Atomic Energy Agency
Vienna International Centre
PO Box 100, A-1400 Vienna,
Austria
Tel.: +43 1 2600 22529, +43 1 2600 22530
Email: sales.publications@iaea.org
<dd id="rw0xn"></dd>
